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Appendices to Improving Patent Examination Efficiency and Quality


Ayal Sharon


affiliation not provided to SSRN

Yifan Liu


George Mason University - Systems Engineering and Operations Research Department (SEOR)

Federal Circuit Bar Journal, Vol. 17, No. 2, 2007

Abstract:     
The math and data used in the Improving Patent Examination Efficiency and Quality are detailed in these appendices.

Number of Pages in PDF File: 26

Keywords: USPTO patent reform queuing model limit continuation applications

JEL Classification: K40, C69

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Date posted: November 2, 2007 ; Last revised: March 12, 2013

Suggested Citation

Sharon, Ayal and Liu, Yifan, Appendices to Improving Patent Examination Efficiency and Quality. Federal Circuit Bar Journal, Vol. 17, No. 2, 2007. Available at SSRN: http://ssrn.com/abstract=1026372

Contact Information

Ayal Sharon (Contact Author)
affiliation not provided to SSRN
Yifan Liu
George Mason University - Systems Engineering and Operations Research Department (SEOR) ( email )
Fairfax, VA
United States
(703) 993-4620 (Phone)
(703) 993-1521 (Fax)
Feedback to SSRN (Beta)


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