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IQ and the R&D Market Value Puzzle


Anne Marie Knott


Washington University in Saint Louis - John M. Olin Business School

Carl Vieregger


Washington University in Saint Louis - John M. Olin Business School

James Yen


Washington University in Saint Louis - John M. Olin Business School

August 22, 2011


Abstract:     
The dominant measures of R&D effectiveness in studies of innovation are patent counts and R&D expenditures. Patent counts are problematic because they are neither universal (less than 50% of firms conducting R&D have any patents) nor uniform (10% of patents account for 85% of economic value). R&D expenditures are problematic because they are an input rather than an output. Moreover both measures exhibit anomalies in models of market value. Thus they are unreliable We propose and test a novel measure of R&D effectiveness (IQ) that appears to be universal, uniform and reliable.

Number of Pages in PDF File: 34

Keywords: R&D, market value, IQ

JEL Classification: D24

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Date posted: November 19, 2009 ; Last revised: September 7, 2011

Suggested Citation

Knott, Anne Marie, Vieregger, Carl and Yen, James, IQ and the R&D Market Value Puzzle (August 22, 2011). Available at SSRN: http://ssrn.com/abstract=1410853 or http://dx.doi.org/10.2139/ssrn.1410853

Contact Information

Anne Marie Knott (Contact Author)
Washington University in Saint Louis - John M. Olin Business School ( email )
One Brookings Drive
Campus Box 1133
St. Louis, MO 63130-4899
United States
Carl Vieregger
Washington University in Saint Louis - John M. Olin Business School ( email )
One Brookings Drive
Campus Box 1133
St. Louis, MO 63130-4899
United States
James Yen
Washington University in Saint Louis - John M. Olin Business School ( email )
One Brookings Drive
Campus Box 1133
St. Louis, MO 63130-4899
United States
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