Abstract

 
 

References (22)



 


 



Where to Find Positive Productivity Spillovers from FDI in China: Disaggregated Analysis


Galina Hale


Federal Reserve Bank of San Francisco

Cheryl X. Long


Colgate University - Economics Department

June 29, 2010

HKIMR Working Paper No.14/2010

Abstract:     
Using panel data from Chinese Industrial Surveys of Medium-sized and Large Firms for 2000-06, we show that while there is evidence of positive technological spillovers from FDI, such spillovers are very unevenly distributed. For some industries, there are positive spillovers from FDI presence in the same industry and province, but for others spillovers are negative. There are positive spillovers from FDI presence in upstream and downstream industries, but such spillovers mostly occur in private firms. There are more spillovers from foreign capital that comes from outside the greater China area.

Number of Pages in PDF File: 30

Keywords: FDI, Spillovers, Forward-Backward Linkages, China

JEL Classification: L33, F23, O17

working papers series


Download This Paper

Date posted: June 30, 2010  

Suggested Citation

Hale, Galina and Long, Cheryl X., Where to Find Positive Productivity Spillovers from FDI in China: Disaggregated Analysis (June 29, 2010). HKIMR Working Paper No.14/2010. Available at SSRN: http://ssrn.com/abstract=1632083 or http://dx.doi.org/10.2139/ssrn.1632083

Contact Information

Galina Hale (Contact Author)
Federal Reserve Bank of San Francisco ( email )
101 Market Street
San Francisco, CA 94105
United States
415-974-3131 (Phone)
415-974-2168 (Fax)
HOME PAGE: http://www.sf.frb.org/economics/economists/index.html
Cheryl X. Long
Colgate University - Economics Department ( email )
13 Oak Drive
Hamilton, NY 13346
United States
Feedback to SSRN (Beta)


Paper statistics
Abstract Views: 245
Downloads: 55
Download Rank: 191,929
References:  22

© 2013 Social Science Electronic Publishing, Inc. All Rights Reserved.  FAQ   Terms of Use   Privacy Policy   Copyright
This page was processed by apollo2 in 0.750 seconds