Abstract

 
 

References (38)



 


 



Systematic Risk Under Extremely Adverse Market Conditions


Maarten R.C. Van Oordt


De Nederlandsche Bank

Chen Zhou


De Nederlandsche Bank; Erasmus University Rotterdam (EUR) - Erasmus School of Economics (ESE)

February 7, 2011

De Nederlandsche Bank Working Paper No. 281

Abstract:     
Extreme losses are the major concern in risk management. However, the dependence between financial assets and the market portfolio is known to change under extremely adverse market conditions. This is why we develop a measure of systematic tail risk, the tail regression beta, defined by an asset’s sensitivity to large negative market shocks, and establish the estimation methodology.

In our estimation methodology we exploit the heavy tail feature of financial returns instead of applying a linear regression based on tail observations. We find that the estimator of the tail regression beta has a similar structure as the estimator of the regular beta from regression analysis. Simulations show that our estimation methodology yields an estimator that has a lower mean squared error than just performing regressions in the tail.

In an empirical exercise we compare the tail regression beta of industry portfolios to regular systematic risk measures: the market beta and the downside beta. The results demonstrate that the portfolio sensitivity to regular systematic risk is in general different from the sensitivity to systematic risk in severe market downturns. Hence, for risk management purposes, estimating the tail regression beta is an informative addition to the regular beta analysis.

Furthermore, the tail regression beta is a useful instrument in both portfolio risk management and systemic risk management. We demonstrate its applications in analyzing Value-at-Risk (VaR) and Conditional Value-at-Risk (CoVaR).

Number of Pages in PDF File: 41

Keywords: Tail Regression Beta, Downside Risk, Extreme Value Theory, Tail Dependence, Risk Management

JEL Classification: C14, G11

working papers series


Download This Paper

Date posted: March 7, 2011 ; Last revised: January 6, 2012

Suggested Citation

Van Oordt, Maarten R.C. and Zhou, Chen, Systematic Risk Under Extremely Adverse Market Conditions (February 7, 2011). De Nederlandsche Bank Working Paper No. 281. Available at SSRN: http://ssrn.com/abstract=1780307 or http://dx.doi.org/10.2139/ssrn.1780307

Contact Information

Maarten R.C. Van Oordt (Contact Author)
De Nederlandsche Bank ( email )
P.O. Box 98
1000 AB Amsterdam
Netherlands

Chen Zhou
De Nederlandsche Bank ( email )
PO Box 98
1000 AB Amsterdam
Amsterdam, 1000 AB
Netherlands

Erasmus University Rotterdam (EUR) - Erasmus School of Economics (ESE) ( email )
P.O. Box 1738
3000 DR Rotterdam, NL 3062 PA
Netherlands
Feedback to SSRN (Beta)


Paper statistics
Abstract Views: 576
Downloads: 147
Download Rank: 99,746
References:  38

© 2013 Social Science Electronic Publishing, Inc. All Rights Reserved.  FAQ   Terms of Use   Privacy Policy   Copyright
This page was processed by apollo4 in 1.359 seconds