Abstract

  
 

Citations



 


 



Examiner Citations, Applicant Citations, and the Private Value of Patents


Deepak Hegde


New York University (NYU) - Leonard N. Stern School of Business

Bhaven N. Sampat


Columbia University - Mailman School of Public Health
August 14, 2009

Economics Letters, Vol. 105, No. 3, 2009

Abstract:     
Examiner citations to a patent are stronger predictors than applicant citations of a widely used measure of patent value: whether a patent has been (or will be) renewed.

Accepted Paper Series


Date posted: April 12, 2011  

Suggested Citation

Hegde, Deepak and Sampat, Bhaven N., Examiner Citations, Applicant Citations, and the Private Value of Patents (August 14, 2009). Economics Letters, Vol. 105, No. 3, 2009. Available at SSRN: http://ssrn.com/abstract=1807078

Contact Information

Deepak Hegde (Contact Author)
New York University (NYU) - Leonard N. Stern School of Business ( email )
44 West 4th Street
New York, NY NY 10012
United States

Bhaven N. Sampat
Columbia University - Mailman School of Public Health ( email )
600 West 168th St. 6th Floor
New York, NY 10032
United States
Feedback to SSRN (Beta)


Paper statistics
Abstract Views: 146
Paper comments
No comments have been made on this paper

© 2013 Social Science Electronic Publishing, Inc. All Rights Reserved.  FAQ   Terms of Use   Privacy Policy   Copyright
This page was processed by apollo8 in 0.422 seconds