Abstract

 
 

References (38)



 


 



Estimating the Gains from Trade in the Market for Innovation: Evidence from the Transfer of Patents


Carlos J. Serrano


Universitat Pompeu Fabra, Barcelona GSE; University of Toronto - Rotman School of Management, RIIB; National Bureau of Economic Research (NBER)

July 31, 2011


Abstract:     
The "market for innovation" - the sale and licensing of patents - is an often discussed source of incentives to invest in R&D. This article presents and estimates a model of the transfer and renewal of patents that, under some assumptions, allows us to quantify the gains resulting from the transfer of patents in the market for innovation. The gains from trade measure the benefits of reallocating the ownership of a patent from the original inventor to a new owner for whom the patent has a higher value. In addition, we study the effect that lowering the costs of technology transfer has on the proportion of patents traded and the gains from trade.

Number of Pages in PDF File: 46

Keywords: Market for Technology, Gains from Trade, Transfer of Patents, Patent

JEL Classification: L24, O32, O34

working papers series


Download This Paper

Date posted: October 5, 2011  

Suggested Citation

Serrano, Carlos J., Estimating the Gains from Trade in the Market for Innovation: Evidence from the Transfer of Patents (July 31, 2011). Available at SSRN: http://ssrn.com/abstract=1939375 or http://dx.doi.org/10.2139/ssrn.1939375

Contact Information

Carlos J. Serrano (Contact Author)
Universitat Pompeu Fabra, Barcelona GSE ( email )
Ramon Trias Fargas 25-27
Barcelona, 08005
Spain
HOME PAGE: http://www.econ.upf.edu/~cserrano
University of Toronto - Rotman School of Management, RIIB
105 St. George Street
Toronto, Ontario M5S 3E6
Canada
National Bureau of Economic Research (NBER)
1050 Massachusetts Avenue
Cambridge, MA 02138
United States
Feedback to SSRN (Beta)


Paper statistics
Abstract Views: 112
Downloads: 15
References:  38
Paper comments
No comments have been made on this paper

© 2013 Social Science Electronic Publishing, Inc. All Rights Reserved.  FAQ   Terms of Use   Privacy Policy   Copyright
This page was processed by apollo4 in 1.173 seconds