Abstract

  


 



Life after P-Hacking


Joseph P. Simmons


University of Pennsylvania - The Wharton School; University of Pennsylvania - Operations & Information Management Department

Leif D. Nelson


University of California, Berkeley - Haas School of Business

Uri Simonsohn


University of Pennsylvania - The Wharton School
2013

Meeting of the Society for Personality and Social Psychology, New Orleans, LA, 17-19 January 2013

Abstract:     
In this presentation, we discussed how researchers' commitment to avoid p-hacking will affect their research lives. One conclusion is that most experimental research cannot be successful without at least 50 observations per condition.

Number of Pages in PDF File: 38

Keywords: false-positive psychology, research methods

working papers series


Download This Paper

Date posted: January 22, 2013  

Suggested Citation

Simmons, Joseph P., Nelson, Leif D. and Simonsohn, Uri, Life after P-Hacking (2013). Meeting of the Society for Personality and Social Psychology, New Orleans, LA, 17-19 January 2013. Available at SSRN: http://ssrn.com/abstract=2205186 or http://dx.doi.org/10.2139/ssrn.2205186

Contact Information

Joseph P. Simmons (Contact Author)
University of Pennsylvania - The Wharton School ( email )
3733 Spruce Street
Philadelphia, PA 19104-6374
United States
University of Pennsylvania - Operations & Information Management Department ( email )
Jon M. Huntsman Hall
3730 Walnut Street
Philadelphia, PA 19104
United States
HOME PAGE: http://opimweb.wharton.upenn.edu/people/faculty.cfm?id=1666

Leif D. Nelson
University of California, Berkeley - Haas School of Business ( email )
545 Student Services Building
Berkeley, CA 94720
United States
Uri Simonsohn
University of Pennsylvania - The Wharton School ( email )
3730 Walnut Street
JMHH 500
Philadelphia, PA 19104-6365
United States
Feedback to SSRN (Beta)


Paper statistics
Abstract Views: 1,994
Downloads: 546
Download Rank: 22,654
Paper comments
No comments have been made on this paper

© 2013 Social Science Electronic Publishing, Inc. All Rights Reserved.  FAQ   Terms of Use   Privacy Policy   Copyright
This page was processed by apollo6 in 0.453 seconds