Abstract

 
 

Citations



 


 



The Heckman Correction for Sample Selection and Its Critique ? A Short Survey


Patrick A. Puhani


Leibniz University Hannover; University of St. Gallen - Swiss Institute for International Economics and Applied Economic Research; Institute for the Study of Labor (IZA); Université Paris II - Panthéon-Assas


Journal of Economic Surveys, Vol. 14, Iss. 1, Pp. 53-68, February 2000

Abstract:     
This paper gives a short overview of Monte Carlo studies on the usefulness of Heckman?s (1976, 1979) two?step estimator for estimating a selection model. It shows that exploratory work to check for collinearity problems is strongly recommended before deciding on which estimator to apply. In the absence of collinearity problems, the full?information maximum likelihood estimator is preferable to the limited?information two?step method of Heckman, although the latter also gives reasonable results. If, however, collinearity problems prevail, subsample OLS (or the Two?Part Model) is the most robust amongst the simple?to?calculate estimators.

JEL Classification: C15

Accepted Paper Series


Date posted: November 24, 2000  

Suggested Citation

Puhani, Patrick A., The Heckman Correction for Sample Selection and Its Critique ? A Short Survey. Journal of Economic Surveys, Vol. 14, Iss. 1, Pp. 53-68, February 2000. Available at SSRN: http://ssrn.com/abstract=229516

Contact Information

Patrick A. Puhani (Contact Author)
Leibniz University Hannover ( email )
Institut für Arbeitsökonomik
Koenigsworther Platz 1
30167 Hannover, DE 30167
Germany
University of Saint Gallen - Swiss Institute for International Economics and Applied Economic Research ( email )
Dufourstr. 48
St. Gallen, 9000
Switzerland
+41 71 224 2341 (Phone)
+41 71 224 2298 (Fax)
Institute for the Study of Labor (IZA)
P.O. Box 7240
Bonn, D-53072
Germany
Université Paris II - Panthéon-Assas
12 place du Pantheon
Paris cedex 06, 75231
France
Feedback to SSRN (Beta)


Paper statistics
Abstract Views: 2,366

© 2013 Social Science Electronic Publishing, Inc. All Rights Reserved.  FAQ   Terms of Use   Privacy Policy   Copyright
This page was processed by apollo7 in 0.797 seconds