Abstract

 
 

References (20)



 
 

Citations (5)



 


 



An Improved Estimation Method and Empirical Properties of the Probability of Informed Trading


Yuxing Yan


Hofstra University

Shaojun Zhang


Hong Kong Polytechnic University

March 9, 2010


Abstract:     
We propose a method to overcome a bias in the estimate of the probability of informed trading (PIN). This bias arises when the numerical maximization procedure generates corner solutions. We analyze the PIN estimates for about 80,000 stock-quarter pairs between 1993 and 2004, and observe a decreasing trend in PIN over this time period. The decimalization in January 2001 appears to accelerate this trend; the quarterly median PIN across stocks decreased by 20% since the first quarter of 2001 until the end of 2004. This provides direct evidence that the risk of trading against informed traders has reduced in recent years. We also find that the risk of informed trading is lower in the first quarter of a year than in the previous fourth quarter, especially for stocks whose price has gone up in previous year.

Number of Pages in PDF File: 45

Keywords: decimalization, informed trading, market microstructure, PIN, tax-loss selling

JEL Classification: C13, C61, G12, G14

working papers series


Download This Paper

Date posted: March 14, 2006 ; Last revised: August 8, 2011

Suggested Citation

Yan, Yuxing and Zhang, Shaojun, An Improved Estimation Method and Empirical Properties of the Probability of Informed Trading (March 9, 2010). Available at SSRN: http://ssrn.com/abstract=890486 or http://dx.doi.org/10.2139/ssrn.890486

Contact Information

Yuxing Yan
Hofstra University ( email )
134 Hofstra University
Hempstead, NY 11549
United States
516-463-5361 (Phone)
Shaojun Zhang (Contact Author)
Hong Kong Polytechnic University ( email )
Hung Hom
Hung Hom, Kowloon, 0
Hong Kong
Feedback to SSRN (Beta)


Paper statistics
Abstract Views: 2,652
Downloads: 802
Download Rank: 13,236
References:  20
Citations:  5

© 2013 Social Science Electronic Publishing, Inc. All Rights Reserved.  FAQ   Terms of Use   Privacy Policy   Copyright
This page was processed by apollo2 in 0.469 seconds