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Unit Root Tests with Wavelets


Ramazan Gencay


Simon Fraser University

Yanqin Fan


Vanderbilt University - College of Arts and Science - Department of Economics

May 1, 2008

Econometric Theory, Vol. 26, pp. 1305-1331, 2010

Abstract:     
This paper develops a wavelet (spectral) approach to test the presence of a unit root in a stochastic process. The wavelet approach is appealing, since it is based directly on the different behavior of the spectra of a unit root process and that of a short memory stationary process. By decomposing the variance (energy) of the underlying process into the variance of its low frequency components and that of its high frequency components via the discrete wavelet transformation (DWT), we design unit root tests against near unit root alternatives. Since DWT is an energy preserving transformation and able to disbalance energy across high and low frequency components of a series, it is possible to isolate the most persistent component of a series in a small number of scaling coefficients. We demonstrate the size and power properties of our tests through Monte Carlo simulations.

Number of Pages in PDF File: 30

Keywords: Unit root tests, cointegration, discrete wavelet transformation, maximum overlap wavelet transformation, energy decomposition

JEL Classification: C1, C2, C12, C22, F31, G0, G1

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Date posted: May 26, 2008 ; Last revised: December 24, 2011

Suggested Citation

Gencay, Ramazan and Fan, Yanqin, Unit Root Tests with Wavelets (May 1, 2008). Econometric Theory, Vol. 26, pp. 1305-1331, 2010. Available at SSRN: http://ssrn.com/abstract=906975

Contact Information

Ramazan Gencay (Contact Author)
Simon Fraser University ( email )
Department of Economics
8888 University Drive
Burnaby, British Columbia V5A 1S6
Canada
Yanqin Fan
Vanderbilt University - College of Arts and Science - Department of Economics ( email )
Box 1819 Station B
Nashville, TN 37235
United States
Feedback to SSRN (Beta)


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