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Learning by Suing: Structural Estimates of Court Errors in Patent Litigation

Alan C. Marco
Washington and Lee University; Vassar College - Department of Economics


October 21, 2006

1st Annual Conference on Empirical Legal Studies Paper

Abstract:     
This paper presents structural estimates of the probability of validity, and the probability of Type I and Type II errors by courts in patent litigation. Patents are modeled as uncertain property rights, and implications of the model are tested using stock market reactions to patent litigation decisions. While court errors are inherently unobservable, the estimation quantifies beliefs about patent validity and court errors in a Bayesian context by relying on observable win rates and stock market reactions. I estimate that the underlying beliefs about validity average from 0.55 to 0.70 for litigated patents. For a number of different specifications, I show that Type I errors (finding a valid patent invalid) occur with an estimated probability of 0.20 to 0.25. The range for Type II errors (finding an invalid patent valid) varies more broadly, from near zero probability to as high as 0.40. Additional implications of the model address patent value.

Keywords: patents, uncertainty, litigation, innovation, event study

JEL Classifications: L19, L29, O32, O34, K41

Working Paper Series

Date posted: July 05, 2006 ; Last revised: October 23, 2006

Suggested Citation

Marco, Alan C., Learning by Suing: Structural Estimates of Court Errors in Patent Litigation (October 21, 2006). Available at SSRN: http://ssrn.com/abstract=913408


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Contact Information

Alan C. Marco (Contact Author)
Washington and Lee University ( email )
Lexington, VA 24450
United States
Vassar College - Department of Economics ( email )
124 Raymond Avenue #592
Poughkeepsie, NY 12604
United States
845.437.7669 (Phone)
845.437.7576 (Fax)
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