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Can Post-Grant Reviews Improve Patent System Design? A Twin Study of US and European Patents


Stuart J. H. Graham


Georgia Institute of Technology - Scheller College of Business; Office of Chief Economist, United States Patent and Trademark Office

Dietmar Harhoff


University of Munich - Munich School of Management; Centre for Economic Policy Research (CEPR); Center for European Economic Research (ZEW); Institute for Fiscal Studies (IFS); CESifo (Center for Economic Studies and Ifo Institute for Economic Research)

May 2006

CEPR Discussion Paper No. 5680

Abstract:     
This paper assesses the impact of adopting a post-grant review institution in the US patent system by comparing the 'opposition careers' of European Patent Office (EPO) equivalents of litigated US patents to those of a control group of EPO patents. We demonstrate several novel methods of 'twinning' US and European patents and investigate the implications of employing these different methods in our data analysis. We find that EPO equivalents of US litigated patent applications are more likely to be awarded EPO patent protection than are equivalents of unlitigated patents, and the opposition rate for EPO equivalents of US litigated patents is about three times higher than for equivalents of unlitigated patents. Patents attacked under European opposition are shown to be either revoked completely or narrowed in about 70 percent of all cases. For EPO equivalents of US litigated patents, the appeal rate against opposition outcomes is considerably higher than for control-group patents. Based on our estimates, we calculate a range of net welfare benefits that would accrue from adopting a post-grant review system. Our results provide strong evidence that the United States could benefit substantially from adopting an administrative post-grant patent review, provided that the post-grant mechanism is not too costly.

Number of Pages in PDF File: 46

Keywords: Patent system, post-grant review, opposition, litigation

JEL Classification: K11, K41, L10

working papers series


Date posted: August 2, 2006  

Suggested Citation

Graham, Stuart J. H. and Harhoff, Dietmar, Can Post-Grant Reviews Improve Patent System Design? A Twin Study of US and European Patents (May 2006). CEPR Discussion Paper No. 5680. Available at SSRN: http://ssrn.com/abstract=921826

Contact Information

Stuart J.H. Graham
Georgia Institute of Technology - Scheller College of Business ( email )
800 W. Peachtree Str. NW
Atlanta, GA 30308
United States
404-385-5107 (Phone)
404-894-6030 (Fax)
Office of Chief Economist, United States Patent and Trademark Office ( email )
600 Dulany Street
Alexandria, VA 22314
United States
HOME PAGE: http://www.uspto.gov
Dietmar Harhoff (Contact Author)
University of Munich - Munich School of Management ( email )
Institute for Innovation Research (INNO-tec)
Kaulbachstr. 45
Munich, 80539
Germany
+49 89 2180 2239 (Phone)
+49 89 2180 6284 (Fax)
HOME PAGE: http://www.inno-tec.de
Centre for Economic Policy Research (CEPR)
77 Bastwick Street
London, EC1V 3PZ
United Kingdom
Center for European Economic Research (ZEW)
P.O. Box 10 34 43
L 7,1 D-68161 Mannheim
Germany
Institute for Fiscal Studies (IFS)
7 Ridgmount Street
London, WC1E 7AE
United Kingdom
CESifo (Center for Economic Studies and Ifo Institute for Economic Research)
Poschinger Str. 5
Munich, DE-81679
Germany
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References:  39
Citations:  5

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