Spectral Analysis and Temperature Measurement During Flash Sintering Under AC Electric Field

29 Pages Posted: 4 Apr 2019

See all articles by Harry Charalambous

Harry Charalambous

Rutgers University - Department of Materials Science and Engineering

Shikhar Krishn Jha

Rutgers University, Piscataway - Department of Materials Science and Engineering

John Okasinski

Argonne National Laboratory - Advanced Photon Source (APS)

Thomas Tsakalakos

Rutgers University - Department of Materials Science and Engineering

Date Written: April 3, 2019

Abstract

In-situ diffraction experiments were used to study the change in peak profiles of 8YSZ during conventional sintering and flash sintering under AC electric field. Using calibration from a conventionally heated standard, the lattice expansion of 8YSZ under flash conditions was correlated to actual specimen temperature, indicating temperature comparable to that required for conventional sintering. At higher current densities, a temperature rise greater than 2000 °C was reached, which resulted in abnormal grain growth and temperature instability. Microstructural analysis demonstrated that finer grain size can be achieved by limiting the current in order to avoid high specimen temperatures. Experiments varying the thickness of the green compact resulted in higher heat loss due to thermal conduction and corresponding reduction in final density. A replacement to the blackbody radiation model was successfully used to fit the data and explain all effects based on Joule heating as well as provide a flash sintering processing map incorporating furnace temperature, power dissipation, and sample geometry.

Keywords: flash sintering, 8YSZ, energy dispersive diffraction, fast firing, processing map

Suggested Citation

Charalambous, Harry and Jha, Shikhar Krishn and Okasinski, John and Tsakalakos, Thomas, Spectral Analysis and Temperature Measurement During Flash Sintering Under AC Electric Field (April 3, 2019). Available at SSRN: https://ssrn.com/abstract=3365143 or http://dx.doi.org/10.2139/ssrn.3365143

Harry Charalambous (Contact Author)

Rutgers University - Department of Materials Science and Engineering ( email )

Piscataway, NJ
United States

Shikhar Krishn Jha

Rutgers University, Piscataway - Department of Materials Science and Engineering

Piscataway, NJ
United States

John Okasinski

Argonne National Laboratory - Advanced Photon Source (APS)

9700 S. Cass Avenue
Building 401
Lemont, IL 60439
United States

Thomas Tsakalakos

Rutgers University - Department of Materials Science and Engineering

Piscataway, NJ
United States

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