Effect of Roasting Temperature and Duration on Color and Flavor of a Sesame Oligosaccharide-Protein Complex in a Maillard Reaction Model

26 Pages Posted: 26 Sep 2022

See all articles by Qing Guo

Qing Guo

Henan University of Technology

Shuai Xu

Henan University of Technology

Hua-Min Liu

Henan University of Technology

Ming-Wei Liu

Henan University of Technology

Chen-Xu Wang

Henan University of Technology

Zhao Qin

Henan University of Technology

Xue-De Wang

Henan University of Technology

Abstract

In this work, sesame oligosaccharides (SOL) and sesame protein isolate (SPI) were isolated from dehulled sesame meal, combined and then tested as a sesame model system, to investigate the effects of roasting temperature and duration on color and flavor. The results demonstrated that SOL is more easily degraded than SPI; specifically, SOL and SPI gradually degraded at 100°C and 150°C, respectively. FT-IR analysis showed that characteristic bonds existing in the roasted samples were somewhat destroyed by roasting. Galactose, fructose, lysine, cysteine, and arginine showed higher reduction and played an important role in color variation and flavor compounds formation according to monosaccharide and amino acid analysis. Total color difference ( Δ E ) and browning intensity increased with roasting temperature and roasting duration. The types and concentrations of volatile flavor compounds were significantly increased, particularly heterocyclics (14.1%-34.4%) and phenols (28.4%-32.4%), corresponding to 0.3% and 8.9% of the unroasted samples.

Keywords: Maillard model, Oligosaccharides, Sesame protein isolate, Color, Volatile compounds

Suggested Citation

Guo, Qing and Xu, Shuai and Liu, Hua-Min and Liu, Ming-Wei and Wang, Chen-Xu and Qin, Zhao and Wang, Xue-De, Effect of Roasting Temperature and Duration on Color and Flavor of a Sesame Oligosaccharide-Protein Complex in a Maillard Reaction Model. Available at SSRN: https://ssrn.com/abstract=4230528 or http://dx.doi.org/10.2139/ssrn.4230528

Qing Guo

Henan University of Technology ( email )

China

Shuai Xu

Henan University of Technology ( email )

China

Hua-Min Liu (Contact Author)

Henan University of Technology ( email )

China

Ming-Wei Liu

Henan University of Technology ( email )

China

Chen-Xu Wang

Henan University of Technology ( email )

China

Zhao Qin

Henan University of Technology ( email )

China

Xue-De Wang

Henan University of Technology ( email )

China

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