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Guanghui Huo

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Dependence of Electrical and Optoelectronic Properties on the Metal Contact and Thickness of MBE-Grown Tellurium Thin Films

Number of pages: 34 Posted: 21 Jan 2026
Chengkai Tang, Tao Hu, Qiaochu Chen, Yu Jia, Guanghui Huo, Jing Yang, yuanyuan zhang, Xiaodong Tang, Wei Bai and Junhao Chu
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and Fudan University
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Te thin films, Molecular beam epitaxy (MBE), Metal contact engineering, Electrical properties, Optoelectronic performance