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Mikael Kritikos

affiliation not provided to SSRN

SCHOLARLY PAPERS

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Scholarly Papers (1)

1.

In-situ synchrotron X-ray diffraction investigation of microstructure evolution in Cr-doped cemented carbide during high-temperature creep deformation

Number of pages: 23 Posted: 02 Feb 2026
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, University of Oxford - Department of Materials, affiliation not provided to SSRN, Diamond Light Source - Harwell Science and Innovation Campus, affiliation not provided to SSRN, Seco Tools AB, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Lund University and Royal Institute of Technology (KTH) - Department of Materials Science and Engineering
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Abstract:

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WC-Co, Cr, high-temperature, hard metals, synchrotron x-ray diffraction (SXRD), in-situ, compression test