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T. Meyyappan

Alagappa University - Department of Computer Science and Engineering

Lecturer

Karaikudi

Tamil Nadu

India

  • Alagappa University - Department of Computer Science and Engineering

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Scholarly Papers (1)

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Heuristic Approach To Optimize the Number of Test Cases for Simple Circuits

International journal of VLSI design & Communication Systems (VLSICS) Vol.1, No.3, September 2010
Number of pages: 9 Posted: 14 May 2021
S. M. Thamarai, K. Kuppusamy and T. Meyyappan
Alagappa University - Department of Computer Science and Engineering, Alagappa University - Department of Computer Science and Engineering and Alagappa University - Department of Computer Science and Engineering
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Abstract:

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Adaptive Scheduled Fault Detection, Combinational Circuits, Fault Library, Heuristic Approach, Test Minimization