default author photo

Kenley Hendrawan

Lawrence Livermore National Laboratory

P.O. Box 808

Livermore, CA 94551

United States

SCHOLARLY PAPERS

1

DOWNLOADS

30

TOTAL CITATIONS

0

Scholarly Papers (1)

Highly anisotropic thermostructural properties of graphite revealed by in situ X-ray diffraction up to 2500 °C

Number of pages: 14 Posted: 08 Apr 2026
Rutgers University - Department of Materials Science and Engineering, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory, University of California, Davis, University of California, Davis, University of California, Davis - Department of Materials Science and Engineering, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory and Lawrence Livermore National Laboratory
Downloads 22 (1,500,232)

Abstract:

Loading...

Graphite, conical nozzle levitator, synchrotron X-ray diffraction, stacking faults, coefficient of thermal expansion, anisotropic displacement parameter

Highly anisotropic thermostructural properties of graphite revealed by in situ X-ray diffraction up to 2500 °C

Number of pages: 14 Posted: 19 May 2026
Rutgers University - Department of Materials Science and Engineering, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory, University of California, Davis, University of California, Davis, University of California, Davis - Department of Materials Science and Engineering, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory, Lawrence Livermore National Laboratory and Lawrence Livermore National Laboratory
Downloads 8 (1,621,812)

Abstract:

Loading...

Graphite, conical nozzle levitator, Synchrotron X-ray diffraction, stacking faults, coefficient of thermal expansion, anisotropic displacement parameter