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Feng Si

affiliation not provided to SSRN

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Temperature-Activated Dielectric Relaxation Mechanisms in BeO–TiO₂ Ceramics for High-Temperature Microwave Attenuation

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Temperature-Activated Dielectric Relaxation Mechanisms in BeO–TiO₂ Ceramics for High-Temperature Microwave Attenuation

Number of pages: 21 Posted: 28 Apr 2026
Ran Mo, Mingxing Li, Yuchen Cao, Feng Si, Kai Zhao, Congling Dai, Guo Liu, Jianxun Wang, Jianwei Zhang and Yong Luo
affiliation not provided to SSRN, affiliation not provided to SSRN, Northwestern Polytechnical University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, National University of Defense Technology and affiliation not provided to SSRN
Downloads 16 (1,570,077)

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BeO-TiO₂ ceramics, Dielectric relaxation, activation energy, high-temperature XPS

Temperature-Activated Dielectric Relaxation Mechanisms in BeO–TiO₂ Ceramics for High-Temperature Microwave Attenuation

Number of pages: 21 Posted: 08 May 2026
Ran Mo, Mingxing Li, Yuchen Cao, Feng Si, Kai Zhao, Congling Dai, Guo Liu, Jianxun Wang, Jianwei Zhang and Yong Luo
affiliation not provided to SSRN, affiliation not provided to SSRN, Northwestern Polytechnical University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, National University of Defense Technology and affiliation not provided to SSRN
Downloads 7 (1,640,921)

Abstract:

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BeO-TiO₂ ceramics, Dielectric relaxation, activation energy, high-temperature XPS