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Francisco Guilhien Gomes-Junior

affiliation not provided to SSRN

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When damage goes deep: a multitechnique approach including 3D for soybean seed damage assessment

Number of pages: 42 Posted: 06 May 2026
Rafael Mateus Alves, Julia Marcolan Teixeira, Agide Gimenez Marassi, Fernando Augusto Henning, Renan Caldas Umburanas, Francisco Guilhien Gomes-Junior and Alberto Tannús
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Brazilian Agricultural Research Corporation - Embrapa - Embrapa Soybean, University of São Paulo (USP) - "Luiz de Queiroz" College of Agriculture, affiliation not provided to SSRN and University of São Paulo (USP) - São Carlos Physics Institute
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Seed-quality, Deterioration, RGB-image, X-Ray, Magnetic Resonance Imaging, Tetrazolium.