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Evaluation of Optical and Structural Degradation in HfO2/SiO2 Dielectric Mirrors Induced by 1.5 MeV Helium Ion Irradiation

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Evaluation of Optical and Structural Degradation in HfO2/SiO2 Dielectric Mirrors Induced by 1.5 MeV Helium Ion Irradiation

Number of pages: 20 Posted: 04 Jun 2026

Takumi Sato, Yasuyuki Ogino, Diancheng Geng, Akira Hasegawa, Ryuta Kasada, Misako Miwa, Shigeo Matsuyama, Tomoaki Nambu, Daisuke Ichise, Chiharu Nakatsuji, Keisuke Shigemori and K. Yamanoi

Osaka University, Tohoku University, Tohoku University, Tohoku University, Tohoku University - Institute for Materials Research (IMR), Tohoku University, Tohoku University, Osaka University, Osaka University, Osaka University, The University of Osaka and Osaka University

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Chiharu Nakatsuji

Osaka University

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Scholarly Papers (1)

Evaluation of Optical and Structural Degradation in HfO2/SiO2 Dielectric Mirrors Induced by 1.5 MeV Helium Ion Irradiation

Evaluation of Optical and Structural Degradation in HfO2/SiO2 Dielectric Mirrors Induced by 1.5 MeV Helium Ion Irradiation

Abstract: