Prabhat Deosthali

affiliation not provided to SSRN

SCHOLARLY PAPERS

1

DOWNLOADS

2

SSRN CITATIONS

2

CROSSREF CITATIONS

0

Scholarly Papers (1)

1.

Testing the Robustness of Two-Boundary Control Policies in Semiconductor Manufacturing

Institute of Electrical and Electronics Engineers Transactions on Semiconductor Manufacturing, Vol. 9, No. 2, pp. 285-288, 1996
Number of pages: 4 Posted: 22 Jun 2009 Last Revised: 31 Jan 2019
Houmin Yan, Sheldon Lou, Suresh Sethi, Anne Gardel and Prabhat Deosthali
The Chinese University of Hong Kong (CUHK) - Department of Systems Engineering & Engineering Management, Independent, University of Texas at Dallas - Naveen Jindal School of Management, affiliation not provided to SSRN and affiliation not provided to SSRN
Downloads 2 (639,931)
Citation 2

Abstract:

Loading...

wafer fabrication, production control, robust policy, unreliable machines, cycle time reduction, WIP reduction, semiconductor manufacuring, two-boundary policy, inventory problem