P Sarkar

Bhabha Atomic Research Centre

Mumbai, 400085

India

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Scholarly Papers (1)

1.

Recast Layer Thickness Characterization of Array of Micro Features Using X-Ray Micro Computed Tomography

International Conference on Advances in Thermal Systems, Materials and Design Engineering (ATSMDE2017)
Number of pages: 5 Posted: 12 Feb 2018
Homi Bhabha National Institute, Students, Bhabha Atomic Research Centre, Bhabha Atomic Research Centre and Bhabha Atomic Research Centre
Downloads 17 (586,549)

Abstract:

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Debris Agglomeration, Recast Layer, Reverse Micro EDM, X-Ray Micro Computed Tomography (┬ÁCT)