Mingqiang Li

Peking University - Electron Microscopy Laboratory

Beijing , 100871

China

Peking University - International Center for Quantum Materials

Beijing , 100871

China

Peking University - Academy for Advanced Interdisciplinary Studies

Beijing , 100871

China

SCHOLARLY PAPERS

3

DOWNLOADS

64

SSRN CITATIONS

2

CROSSREF CITATIONS

0

Scholarly Papers (3)

1.

Direct Observation of Weakened Interface Clamping Effect Enabled Ferroelastic Domain Switching

Number of pages: 29 Posted: 07 Jan 2019
Peking University - Electron Microscopy Laboratory, Pennsylvania State University - Department of Materials Science and Engineering, National Chung Hsing University - Department of Materials Science and Engineering, National Chiao Tung University - Department of Materials Science and Engineering, Peking University - Electron Microscopy Laboratory, Peking University - Electron Microscopy Laboratory, Peking University - Academy for Advanced Interdisciplinary Studies, Peking University - Electron Microscopy Laboratory, National Chiao-Tung University - Department of Material Science and Engineering, Pennsylvania State University - Department of Materials Science and Engineering and Peking University - Electron Microscopy Laboratory
Downloads 49 (453,017)
Citation 2

Abstract:

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ferroelastic, domain switching, in situ transmission electron microscopy (TEM), atomic structure, interfaces

2.

Atomic-Environment-Dependent Thickness of Ferroelastic Domain Walls

Number of pages: 23 Posted: 04 Nov 2019
Peking University - Electron Microscopy Laboratory, Chinese Academy of Sciences (CAS) - Beijing National Laboratory for Condensed Matter Physics, Peking University - Electron Microscopy Laboratory, National Chung Hsing University - Department of Materials Science and Engineering, National Chiao-Tung University - Department of Material Science and Engineering and Peking University - Electron Microscopy Laboratory
Downloads 10 (672,699)

Abstract:

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Ferroelastic domain walls, Atomic structure, Polarization, Scanning transmission electron microscopy, Annular bright field image

3.

Effect of Single Point Defect on Local Properties in BiFeO 3 Thin Film

Number of pages: 26 Posted: 26 Mar 2019
Chinese Academy of Sciences (CAS) - Beijing National Laboratory for Condensed Matter Physics, Peking University - Electron Microscopy Laboratory, Chinese Academy of Sciences (CAS) - Beijing National Laboratory for Condensed Matter Physics, Chinese Academy of Sciences (CAS) - Beijing National Laboratory for Condensed Matter Physics, Peking University - Electron Microscopy Laboratory, Peking University - Electron Microscopy Laboratory, Chinese Academy of Sciences (CAS) - Beijing National Laboratory for Condensed Matter Physics, Chinese Academy of Sciences (CAS) - Beijing National Laboratory for Condensed Matter Physics, Chinese Academy of Sciences (CAS) - Beijing National Laboratory for Condensed Matter Physics, Chinese Academy of Sciences (CAS) - Beijing National Laboratory for Condensed Matter Physics, Chinese Academy of Sciences (CAS) - Beijing National Laboratory for Condensed Matter Physics, Chinese Academy of Sciences (CAS) - Beijing National Laboratory for Condensed Matter Physics, Chinese Academy of Sciences (CAS) - Beijing National Laboratory for Condensed Matter Physics, Peking University - Electron Microscopy Laboratory and Chinese Academy of Sciences (CAS) - Beijing National Laboratory for Condensed Matter Physics
Downloads 5 (709,190)

Abstract:

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Ferroelectric, point defect, scanning transmission electron microscopy, quantitative image analysis, density function calculations