Yung Suk Jeremy Yoo

Georgia Institute of Technology - School of Materials Science and Engineering

Atlanta, GA 30332

United States

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Relating Microstructure to Defect Behavior in AA6061 Using a Combined Computational and Multiscale Electron Microscopy Approach

Number of pages: 21 Posted: 28 Mar 2019
Yung Suk Jeremy Yoo, Hojun Lim, John Emery and Josh Kacher
Georgia Institute of Technology - School of Materials Science and Engineering, Sandia National Laboratories (NM), Sandia National Laboratories (NM) and Georgia Institute of Technology - School of Materials Science and Engineering
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Abstract:

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Electron microscopy, finite element, ductile fracture, aluminum