Rajat Agrawal

Indian Institute of Technology (IIT), Roorkee

Roorkee- Haridwar Highway

Century Road

Roorkee, Uttranachal 247667

India

SCHOLARLY PAPERS

4

DOWNLOADS

321

SSRN CITATIONS

0

CROSSREF CITATIONS

0

Scholarly Papers (4)

1.

Measuring Performance of Business Incubators: A Literature Review and Theoretical Framework Development

e-journal - First Pan IIT International Management Conference – 2018
Number of pages: 14 Posted: 13 Jan 2021
Rahul Singh Rathore and Rajat Agrawal
Indian Institute of Technology (IIT), Roorkee - Department of Management Studies and Indian Institute of Technology (IIT), Roorkee
Downloads 239 (177,014)

Abstract:

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Business Incubators, Efficiency, Performance measurement models, productivity, Performance Indicators, Literature Review

2.

Drivers in Adoption of Advanced Manufacturing Management System for Environmental Sustainability

e-journal - First Pan IIT International Management Conference – 2018
Number of pages: 15 Posted: 06 Apr 2020
Ankur Goyal and Rajat Agrawal
Indian Institute of Technology (IIT), Roorkee and Indian Institute of Technology (IIT), Roorkee
Downloads 44 (546,512)

Abstract:

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Advanced Manufacturing Management System, Advanced Manufacturing Techniques, Drivers, Sustainable manufacturing

3.

Government Policies & Rural Development – An Enabler Modelling for Indian Rural Markets

e-journal - First Pan IIT International Management Conference – 2018
Number of pages: 17 Posted: 06 Apr 2020
UPES, Indian Institute of Technology (IIT), Roorkee - Department of Management Studies, Indian Institute of Technology (IIT), Roorkee and IIM Kashipur
Downloads 38 (576,750)

Abstract:

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Enablers, rural market, sociological development, Interpretative structural modelling, fuzzy MICMAC, India

4.

PANIITIMC 2018 Editorial Note

e-journal - First Pan IIT International Management Conference – 2018
Posted: 14 Jan 2021
Rajat Agrawal and Vinay Sharma
Indian Institute of Technology (IIT), Roorkee and Indian Institute of Technology (IIT), Roorkee - Department of Management Studies

Abstract:

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