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Yang Hai

Dongguan University of Technology - Neutron Scattering Technical Engineering Research Center

Dongguan, 523808

China

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Interface Control of Tetragonal Ferroelectric Phase in Ultrathin Si-Doped HfO 2 Epitaxial Films

Number of pages: 29 Posted: 30 Apr 2020
Dongguan University of Technology - Neutron Scattering Technical Engineering Research Center, Chinese Academy of Sciences (CAS) - Beijing Synchrotron Radiation Facility, Chinese Academy of Sciences (CAS) - Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences (CAS) - Songshan Lake Materials Laboratory, Dongguan University of Technology - Neutron Scattering Technical Engineering Research Center, Dongguan University of Technology - Neutron Scattering Technical Engineering Research Center, Dongguan University of Technology - Neutron Scattering Technical Engineering Research Center, University of California, Berkeley - Advanced Light Source, Xi'an Jiaotong University (XJTU) - School of Microelectronics, Xi'an Jiaotong University (XJTU) - School of Microelectronics, Xi'an Jiaotong University (XJTU) - School of Microelectronics, Hubei University - Department of Material Science and Engineering, Nanchang University - School of Materials Science and Engineering, Hong Kong Polytechnic University - Department of Applied Physics and Materials Research Center and Dongguan University of Technology - School of Electrical Engineering & Intelligentization
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Abstract:

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Epitaxial ferroelectric films, Sychrotron X-ray diffraction, Synchrotron X-ray absorption, High-resolution TEM, Pulsed Laser Deposition