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Wieland Heyn
Fraunhofer IKTS
Dresden
Germany
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SCHOLARLY PAPERS
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Scholarly Papers (1)
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Device and Method for Measuring Interface Strength in Microstructures
Number of pages: 17
Posted: 01 Jul 2021
Hanno Melzner
, Wieland Heyn,
Klaus Goller
,
Sergey Ananiev
,
Johannes Zechner
,
André Clausner
,
Cristina Torregiani
and
Ehrenfried Zschech
Infineon Technologies Munich, Fraunhofer IKTS, Infineon Technologies Regensburg, Infineon Technologies Munich, Infineon Technologies Austria AG, Fraunhofer IKTS, Infineon Technologies Munich and Fraunhofer IKTS
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Abstract:
interfaces; fracture; toughness; adhesion
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