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Woo-Jung Lee

Electronics and Telecommunications Research Institute

218 Gajeong-ro, Yuseong-gu

Daejeon, 305-700

Korea, Republic of (South Korea)

  • Electronics and Telecommunications Research Institute

SCHOLARLY PAPERS

3

DOWNLOADS

110

TOTAL CITATIONS

0

Scholarly Papers (3)

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1.

Exciton-Related Carrier Dynamics in the Topological Surface States of Bi2se3

Number of pages: 19 Posted: 24 Apr 2024
Kwangsik Jeong, Hyeongmun Kim, Jonghoon Kim, Seok-Bo Hong, Dajung Kim, Hanbum Park, Seungwon Rho, Woo-Jung Lee, Dae-Hyung Cho, Tae Ha Hwang, Yong-Duck Chung, Chul Kang and Mann-Ho Cho
affiliation not provided to SSRN, affiliation not provided to SSRN, Yonsei University, Yonsei University, Yonsei University, Yonsei University, Yonsei University, Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute, affiliation not provided to SSRN and Yonsei University - Department of Physics
Downloads 59 (970,490)

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Topologicals insulator, Exciton, Bi2Se3, Optical pump THz probe

2.

Modulation of Interfacial Dynamics in Bi₂Se₃/Yb2c3o7 Heterojunctions Via Cracker-Se Processing

Number of pages: 16 Posted: 01 Oct 2024
Woo-Jung Lee, Dae-Hyung Cho, Tae Ha Hwang, Jing Young Maeng, Soyoung Lim, Rina Kim, Yong-Duck Chung and Jong Hyun Song
Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute, Chungnam National University, Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute and Chungnam National University
Downloads 28 (1,345,526)

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YB2C3O7, Bi2Se3, Se-cracking process, interfacial dynamics, Cu diffusion

3.

Modulation of Interfacial Dynamics in Bi2se3/Yba2cu3o7 Heterojunctions Via Cracker-Se Processing

Number of pages: 16 Posted: 12 Oct 2024
Woo-Jung Lee, Dae-Hyung Cho, Tae Ha Hwang, Jing Young Maeng, Soyoung Lim, Rina Kim, Yong-Duck Chung and Jong Hyun Song
Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute, Chungnam National University, Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute, Electronics and Telecommunications Research Institute and Chungnam National University
Downloads 23 (1,411,822)

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YBa2Cu3O7, Bi2Se3, Se-cracking process, interfacial dynamics, Cu diffusion