CL. de Madrid 126
Madrid, 28903
Spain
Charles III University of Madrid
differential phase contrast, STEM, rotational twins, GaInP, Zn dopant, III-V nanowires
Flexible optoelectronics, porous silicon, electrochemical etching, foil detachment, substrate reuse
III-V, Ge|Si, virtual substrates, PECVD, MOVPE, TEM
III-V, Silicon, stacking faults, MOVPE, AsH3, HAADF-EELS
advanced characterization, Inverted metamorphic solar cells, III-V semiconductors, transmission electron microscopy (TEM), high-resolution cross-sectional cathodoluminescence (CL)