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Felipe Kremer

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Scholarly Papers (1)

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High Resolution Study of Thermal Interfacial Oxides in Doped Polycrystalline Silicon Passivating Contacts

Number of pages: 12 Posted: 28 May 2025
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and affiliation not provided to SSRN
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Abstract:

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poly-Si passivating contacts, Tunnel oxide, TEM, Pre-annealing intrinsic poly-Si, Saturation current density