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E. Öztürk

affiliation not provided to SSRN

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Linear Growth of Reaction Layer During In-Situ Tem Annealing of Thin Film Al/Ni Diffusion Couples

Number of pages: 23 Posted: 22 Feb 2022
Aleksander Kostka, D. Naujoks, T. Oellers, S. Salomon, C. Somsen, E. Öztürk, A. Savan, A. Ludwig and Gunther Eggeler
Ruhr University of Bochum, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Ruhr University of Bochum - Institute of Materials, affiliation not provided to SSRN and Ruhr University of Bochum - Institute of Materials
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Abstract:

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thin film, Interdiffusion, Diffusion growth, Growth kinetics, In situ transmission electron microscopy (TEM), XRD