30 Xueyuan Road, Haidian District
beijing, 100083
China
University of Science and Technology Beijing
V-4Cr-4Ti alloy, TiAlN, TiAl, multilayered composite coating, TEM, GD-OES
Bubble, Electron Irradiation, Plasmaization, High-melting-point Metal, Polycrystallization
Superconducting materials, Stacking fault energy, Partial dislocation, Cryogenic temperature, In-situ transmission electron microscopy
Bubble, Electron Irradiation, Plasmaization, High-melting-point metal, Polycrystallization
Crystal defects, Dislocation loops, One-Dimensional Unidirectional Migration, Beryllium