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Ran Zhang

National Institute of Metrology

No.18, Bei San Huan Dong Lu, Chaoyang District

Beijing

China

  • National Institute of Metrology

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Strain States and Evolutionary Mechanisms of Microstructures at the Crack Tips Of Monocrystalline Silicon

Number of pages: 13 Posted: 07 May 2022
Xu Li, Ran Zhang, Yalei Wang, Lei Cui, Senlin Jin, Yi Zhang and Xingfu Tao
National Institute of Metrology, National Institute of Metrology, affiliation not provided to SSRN, affiliation not provided to SSRN, National Institute of Metrology, Henan University of Science and Technology - School of Materials Science and Engineering and National Institute of Metrology
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Abstract:

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strain, Microstructure, dislocation, crack tip, Silicon, Mechanism