Ming-Pei Lu

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The Role of Stacking Faults on the Atom Migration in Ag Nanowire Under Biasing

Number of pages: 17 Posted: 23 Jun 2022
Yu-Hsiang Hsueh, Ashok Ranjan, Lian-Ming Lyu, Kai-Yuan Hsiao, Yu-Cheng Chang, Ming-Pei Lu and Ming-Yen Lu
National Tsing Hua University, National Tsing Hua University, National Tsing Hua University, National Tsing Hua University, Feng Chia University, affiliation not provided to SSRN and National Tsing Hua University
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electromigration, Ag nanowires, stacking faults, current-resist ability, galvanic replacement reaction