38 Vavilov Street
Moscow, 119991
Russia
A.M. Prokhorov General Physics Institute of the Russian Academy of Sciences
semiconductor crystals in glass, laser scanning microscopy, photoluminescence, Spectroscopy, tomography
semiconductor crystals in glass, laser scanning microscopy, Photoluminescence, Spectroscopy, Tomography
Calcium copper phyllo-tetrasilicate, Egyptian blue, photoluminescence, Cathodoluminescence, Light absorption
Thermal-fluctuation mechanism, Stress corrosion, Glass corrosion, Glass depolymerization, Impurity diffusion, Impurity segregation, Glass cracking
Crystals in Murano glass, SEM analysis, EBSD analysis, Roméite group mineral inclusions, Microcathodoluminescence, Silica raw material provenance
diamond, two-photon confocal laser scanning microscopy, NV center, N2V center, laser element, superluminescence
Silicon, germanium, wetting layer, surface energy, quantum dot, scanning tunneling microscopy.
Zinc selenide, Terahertz absorption, Effect of illumination, Defect clusters, Luminescence kinetics
calcium copper phyllo-tetrasilicate, thermal decomposition, differential scanning calorimetry, thermogravimetry, X-ray diffractometry, polarizing microscopy