Jing Zhang

Qilu University of Technology

58 Jiefang E Rd

Jinan, 250353

China

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Influence of Indium Tin Oxide Residues on Electrical Performance of Thin Film Transistors in Backplane of Active Matrix Displays

Number of pages: 40 Posted: 30 Aug 2022

Xiang Yu, Zhiqiang Zhang, Jingxuan Pei, Jing Zhang and Rabah Boukherroub

China University of Geosciences, Beijing, affiliation not provided to SSRN, China University of Geosciences, Beijing, Qilu University of Technology and Université Polytechnique Hauts-de-France

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