P.O. Box 392
UNISA
Pretoria, 0003
South Africa
University of South Africa (UNISA)
Multiple Ionisation, Heavy Ion PIXE, High Resolution PIXE, X-ray fluorescence, Ion Beam Analysis
Heavy Ion PIXE, Multiple Ionisation, X-ray production, ECPSSR, Ion Beam Analysis
Ag+-ion implantation, vanadium dioxide films, Structural properties, Optical properties
silicon, Er implantation, diffusion mechanism, RBS/C, XRD