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Malte Lenz
Friedrich-Alexander-Universität Erlangen-Nürnberg - Institute of Micro- and Nanostructure Research and Center for Nanoanalysis and Electron Microscopy (CENEM)
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SCHOLARLY PAPERS
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Scholarly Papers (1)
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1.
Reliable Identification of the Complex or Superlattice Nature of Intrinsic and Extrinsic Stacking Faults in the L1
2
Phase by High-Resolution Imaging
Number of pages: 25
Posted: 28 Nov 2022
Nicolas Karpstein
, Malte Lenz,
Andreas Bezold
,
Mingjian Wu
,
Steffen Neumeier
and
Erdmann Spiecker
Friedrich-Alexander-Universität Erlangen-Nürnberg - Institute of Micro- and Nanostructure Research and Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander-Universität Erlangen-Nürnberg - Institute of Micro- and Nanostructure Research and Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander-Universität Erlangen-Nürnberg - Department of Materials Science and Engineering, Friedrich-Alexander-Universität Erlangen-Nürnberg - Institute of Micro- and Nanostructure Research and Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander-Universität Erlangen-Nürnberg - Department of Materials Science and Engineering and Friedrich-Alexander-Universität Erlangen-Nürnberg - Institute of Micro- and Nanostructure Research and Center for Nanoanalysis and Electron Microscopy (CENEM)
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Abstract:
Co-base superalloy, electron microscopy, planar defects, Dislocation, creep
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