silicon, surface, etching, ageing, oxidation, model
cast iron, copper, Boron, Ferrite, Graphite Morphology
Silicon, Lomer Dislocation, Density functional theory (DFT), High-Angle Annular Dark Field Scanning Transmission Electron Microscopy (HAADF-STEM), Atom Probe Tomography (APT)
A1.Characterization, A1.Industrial Crystallization, A1.Impurities, A2.Czochralski method, B1.Glasses, B1.Quartz
glass crucibles, Czochralski process, bubbles, viscosity