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Guilhem LARRIEU

affiliation not provided to SSRN

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A Comprehensive Atomistic Picture of the As-Deposited Ni-Si Interface Before Thermal Silicidation Process

Number of pages: 22 Posted: 31 Jan 2023
Anne HEMERYCK, César JARA DONOSO, Antoine Jay, Julien Lam, Jonas MULLER, Guilhem LARRIEU, Georges LANDA, Corrado BONGIORNO, Antonino La Magna and Alessandra ALBERTI
affiliation not provided to SSRN, affiliation not provided to SSRN, École Polytechnique, Paris - LSI, Laboratoire des Solides Irradiés, University of Lille, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and affiliation not provided to SSRN
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silicidation, interface, DFT calculations, as-deposited materials, atomic diffusion, HR-STEM and XRR characterizations