Jonathan Putnam

Yale University

28 Hillhouse Ave

New Haven, CT 06520-8268

United States

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How to Count Patents and Value Intellectual Property: Uses of Patent Renewal and Application Data

NBER Working Paper No. w5741
Number of pages: 33 Posted: 18 Nov 1996 Last Revised: 04 Oct 2010
Jean O. Lanjouw, Ariel Pakes and Jonathan Putnam
University of California, Berkeley, College of Natural Resources, Department of Agricultural & Resource Economics (Deceased), National Bureau of Economic Research (NBER) and Yale University
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Citation 14

Abstract:

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