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Charles William Basso

affiliation not provided to SSRN

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Structural Characterization of Nanometric Pt Films by Electron- and Ion-Based Techniques

Number of pages: 17 Posted: 30 Jun 2023
Henrique Trombini, Felipe Ferreira Selau, Charles William Basso, Pedro Grande, Maarten Vos and Jonder Morais
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Federal University of Rio Grande do Sul (UFRGS/PPGA), affiliation not provided to SSRN and Federal University of Rio Grande do Sul (UFRGS/PPGA)
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Abstract:

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angle-resolved X-ray photoelectron spectroscopy, medium energy ion scattering, electron Rutherford backscattering, ultra-thin films