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Peter Jemian

Government of the United States of America - X-Ray Science Division

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Scholarly Papers (1)

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­In Situ Probing of Interfacial Roughness and Transient Phases During Ceramic Cold Sintering Process

Number of pages: 36 Posted: 05 Jul 2023
Fan Zhang, Russell A. Maier, Igor Levin, Andrew J. Allen, Jun-Sang Park, Peter Kenesei, Ivan Kuzmenko, Peter Jemian and Jan Ilavsky
National Institute of Standards and Technology (NIST) - Materials Measurement Science Division, National Institute of Standards and Technology (NIST) - Materials Measurement Science Division, National Institute of Standards and Technology (NIST) - Materials Measurement Science Division, National Institute of Standards and Technology (NIST) - Materials Measurement Science Division, Government of the United States of America - X-Ray Science Division, Government of the United States of America - X-Ray Science Division, Government of the United States of America - X-Ray Science Division, Government of the United States of America - X-Ray Science Division and Government of the United States of America - X-Ray Science Division
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Abstract:

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ceramic processing, cold sintering, in situ monitoring, small-angle x-ray scattering, High-energy X-ray diffraction