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Melvyn Reynaud

affiliation not provided to SSRN

  • affiliation not provided to SSRN

SCHOLARLY PAPERS

3

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149

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Scholarly Papers (3)

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1.

A New X-Ray Beam Induced Current Setup, Coupled with X-Ray Diffraction Imaging, for Diamonds and Semiconductors Characterization by Synchrotron Techniques at Esrf

Number of pages: 10 Posted: 08 Jul 2023
Fabien Lafont, José Baruchel, Jessica Bousquet, Ennio Capria, Rafael Celestre, Marine Cotte, Denis Dauvergne, Pierre Everaere, Marie-Laure Gallin-Martel, Christophe Hoarau, Oussama Ibourk, Juliette Letellier, Robin Molle, Jean-Francois Muraz, Dov Nusimovici, Melvyn Reynaud and Thu Nhi Tran-Caliste
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, European Synchrotron Radiation Facility (ESRF), affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and affiliation not provided to SSRN
Downloads 83 (783,685)

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Diamond, X-ray Beam Induced CUrrent, X-Ray Bragg diffraction imaging, single crystal, structural defects, Electronic properties

2.

Characterisation of a large-area single-crystal diamond microstrip detector for real-time synchrotron x-ray microbeam monitoring

Number of pages: 32 Posted: 05 Feb 2026
Candice Milewski, Tiago Bettio, Melvyn Reynaud, Jean-François Muraz, Sarvenaz Keshmiri, Maxime Jacquet, Chris Hall, Marie-Laure Gallin-Martel, Laurent Gallin-Martel, Francesca di Franco, Matthew Cameron, Denis Dauvergne, Jean-François Adam and Jayde Livingstone
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, University Grenoble Alpes and affiliation not provided to SSRN
Downloads 39 (1,196,171)

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Diamond, Synchrotron, Monitor, Radiotherapy, Dose

3.

High-fluence light-ion irradiation effects on CVD diamond detectors: Charge Collection Efficiency degradation, defect formation and annealing recovery

Number of pages: 16 Posted: 14 Apr 2026
Robin Molle, Marie-Laure Gallin-Martel, Charbel Koumeir, Latifa Abbassi, Nicolas André, Julien Bassaler, Jessica Bousquet, Denis Dauvergne, Pierre Everaere, Laurent Gallin-Martel, Arnaud Guertin, Ferid Haddad, Christophe Hoarau, Fabien Lafont, Juliette Letellier, Jayde Livingstone, Sara Marcatili, Vincent Metiviez, Jean-François Motte, Quentin Mouchard, Dov Nusimovici, Freddy Poirier, Jean-François Muraz, Melvyn Reynaud, Noël Servagent, Thu Nhi Tran-Caliste, Lucie Valera and Manon Evin
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, University of Nantes, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN and affiliation not provided to SSRN
Downloads 27 (1,448,301)

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single crystal diamond, polycrystalline diamond, charge collection efficiency, radiation tolerance, structural defects, electronic properties