International Exchange Center
Hunan, 411105
China
Xiangtan University
Hf0.5Zr0.5O2 thin film, Ferroelectrics, Total dose irradiation, Radiation damage, Finite element analysis
Al/Ni multilayer film, energy-containing microdevice, ignition threshold, finite element simulation, electric explosion ignition
Al/Ni multilayer film, modulation ratio, self-propagating exothermic reactions, Finite element simulation, ignition performance
Ferroelectrics, Oxygen vacancy, Oxygen plasma, DFT calculations, Electrical properties