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Richard Beanland

University of Warwick

SCHOLARLY PAPERS

3

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134

TOTAL CITATIONS

0

Scholarly Papers (3)

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1.

Microcracks in Cvd Diamond Produced by Scaife Polishing

Number of pages: 15 Posted: 15 Jan 2024
Ebrima Saho, S. Hindmarsh, A.M. Sanchez, Fraser Birks, James R. Kermode, Matthew Dale, David Fisher and Richard Beanland
University of Warwick, University of Warwick, University of Warwick, University of Warwick, University of Warwick, affiliation not provided to SSRN, affiliation not provided to SSRN and University of Warwick
Downloads 68 (891,180)

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Microcracks, Scaife-polishing, Luminescence, Plastic deformation, cathodoluminescence, CVD diamond

2.

Giant Electrostrain (~0.5%) in Sm Doped BiFeO3-PbTiO3 Ceramics Through Field Induced Structural Transformation

Number of pages: 12 Posted: 14 Apr 2026
Xinzhen Wang, Hareem Zubairi, Robin Sjökvist, Muhammad Wasim, Xiaojiao Liu, Annette K. Kleppe, Antonio Feteira, Richard Beanland, Ge Wang and Ian M. Reaney
Shandong University of Science and Technology, Manchester University, University of Warwick, Sheffield Hallam University, Diamond Light Source Ltd, Diamond Light Source Ltd, Sheffield Hallam University, University of Warwick, The University of Manchester - Department of Materials and University of Sheffield
Downloads 37 (1,372,601)

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piezoelectric ceramics, electrostrain, structural transformation, BiFeO3-PbTiO3, in-situ poling XRD

3.

Correlating A and B Site Co-Doping Effects on the Crystallographic Structure and Dielectric Properties of Sr2NaNb5O15 (SNN) Tetragonal Tungsten Bronze (TTB)

Number of pages: 54 Posted: 05 Mar 2026
Celine Marie King, Robin Sjökvist, Mark S. Senn, Jeremiah P. Tidey, Richard Beanland, Rik Drummond-Brydson and Andy P. Brown
University of Leeds, University of Warwick, University of Warwick, University of Warwick, University of Warwick, University of Leeds and University of Leeds
Downloads 29 (1,345,526)

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tetragonal tungsten bronze, temperature stable dielectrics, Rietveld Refinement, variable temperature synchrotron powder X-ray diffraction, Transmission Electron Microscopy