affiliation not provided to SSRN
Narrow Plate Waveguide, SH(0, 1) Mode, face-shear d24 PZT wafer, Dispersion Characteristics, Waveguide Sensor
ACFM, lift-off effect, crack identification, crack quantification
Coplanar capacitive sensing, Non-destructive evaluation (NDE), Spreading effect, Image deconvolution, Point Spread Function (PSF), Total Variation regularization, Defect characterization