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Huan Wu

Chongqing University

Shazheng Str 174, Shapingba District

Shazheng street, Shapingba district

Chongqing 400044, 400030

China

  • Chongqing University

SCHOLARLY PAPERS

5

DOWNLOADS

268

TOTAL CITATIONS

0

Scholarly Papers (5)

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1.

An Investigation of How Circuit Parameters Affect the Short-Circuit Type 2 Ruggedness in Fs-Igbt

Downloads 92 (730,864)

An Investigation of How Circuit Parameters Affect the Short-Circuit Type 2 Ruggedness in Fs-Igbt

Number of pages: 12 Posted: 17 Dec 2024
Jingping Zhang, Houcai Luo, Huan Wu, Bofeng Zheng and Xianping Chen
Chongqing University, Chongqing University, Chongqing University, Chongqing University and Chongqing University
Downloads 51 (1,072,374)

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FS-IGBT, SC2, circuit parameters, ruggedness, tsc.

An Investigation of How Circuit Parameters Affect the Short-Circuit Type 2 Ruggedness in Fs-Igbt

Number of pages: 12 Posted: 14 Dec 2024
Jingping Zhang, Houcai Luo, Huan Wu, Bofeng Zheng and Xianping Chen
Chongqing University, Chongqing University, Chongqing University, Chongqing University and Chongqing University
Downloads 41 (1,196,631)

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FS-IGBT, SC2, circuit parameters, ruggedness, tsc.

2.

A Novel 4h-Sic Sbd-Wall-Integrated Trench Mosfet with Improved Performance

Number of pages: 15 Posted: 19 Nov 2023
Jingping Zhang, Houcai Luo, Huan Wu, Zeping Wang, Bofeng Zheng, Guoqi Zhang and Xianping Chen
Chongqing University, Chongqing University, Chongqing University, Chongqing University, Chongqing University, Delft University of Technology and Chongqing University
Downloads 67 (899,324)

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4H-SiC MOSFET, SBD, reverse recovery, Qrr, switching loss

3.

Design and Fabrication of Fs-Igbt with Strong Short-Circuit Ruggedness

Number of pages: 9 Posted: 13 May 2024
Jingping Zhang, Houcai Luo, Huan Wu, Bofeng Zheng and Xianping Chen
Chongqing University, Chongqing University, Chongqing University, Chongqing University and Chongqing University
Downloads 48 (1,086,013)

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FS-IGBT, cell structure, dummy gate, short-circuit ruggedness, short-circuit withstand time

4.

Dynamic Avalanche Reliability Enhancement of Fs-Igbt Under Unclamped Inductive Switching

Number of pages: 11 Posted: 19 Dec 2024
Jingping Zhang, Houcai Luo, Huan Wu, Bofeng Zheng and Xianping Chen
Chongqing University, Chongqing University, Chongqing University, Chongqing University and Chongqing University
Downloads 33 (1,277,121)

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FS-IGBT, dynamic avalanche, UIS, reliability, circuit parameters.

5.

Performance And Surge Capacity Evaluations of 1.2kv Sic Vdmosfets with Varied Jfet Width

Number of pages: 6 Posted: 14 Dec 2024
Houcai Luo, Jingping Zhang, Ruonan Wang, Huan Wu, Bofeng Zheng, Kai Zheng, Guoqi Zhang and Xianping Chen
Chongqing University, Chongqing University, Chongqing University, Chongqing University, Chongqing University, Chongqing University, Delft University of Technology and Chongqing University
Downloads 28 (1,359,097)

Abstract:

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SiC VDMOSFET, static and dynamic properties, surge, reliability, failure mechanism