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Ran Chen

affiliation not provided to SSRN

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SCHOLARLY PAPERS

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Scholarly Papers (1)

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Impact of Oxide Thickness, Emitter Sheet Resistance, and Polysilicon Doping Concentration on the Passivation Quality and Long-Term Stability of Topcon Solar Cells

Number of pages: 40 Posted: 06 Jan 2024
Chukwuka Madumelu, Feng Bowen, Ji Genhua, Jie Bao, Sim Seunghwan, Ran Chen, Brett Hallam, Bram Hoex and Matthew Wright
affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, University of New South Wales (UNSW) and University of Oxford
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TOPCoN, Degradation, surface passivation, stability, hydrogen, firing stability